Automated enhancement and detection of stripe defects in large circular weft knitted fabrics

Piscataway, NJ / IEEE (2016) [Contribution to a book, Contribution to a conference proceedings]

21th IEEE Conference on Emerging Technologies and Factory Automation (ETFA) : September 6 - 9, 2016, Berlin
Page(s): 4 Seiten


Selected Authors

Kopaczka, Marcin
Ham, Hanry
Simonis, Kristina
Kolk, Raphael
Merhof, Dorit